Consistent, High-precision Current Testing Across a Wide Temperature Range
Hioki AC/DC clamp sensors are best-in-class current sensors for use with power meters, Memory HiCorders and high performance oscilloscopes. The CT6843 is DC to 500 kHz/200 A sensors, ideal for capturing signals during the efficiency testing of batteries, inverters and power conditioners.

Applications

1. Measuring the charge and discharge efficiency of EV/HEV batteries

In some cases, it is not possible to use high-accuracy pass-through sensors to evaluate EVs and HEVs since their wiring cannot be easily disconnected. The CT6841/ CT6843’s clamp-type design simplifies high-accuracy measurement. The resin casing of the clamp is more resistant to deformation from heat than that used in legacy products, allowing you to take measurements inside engine compartments without issue.

2. Evaluating inverter and power conditioner efficiency

A current sensor’s amplitude accuracy and phase accuracy are both important considerations when you need to accurately measure AC power. Phase accuracy has a particularly large effect on power values when the power factor is low. The CT6841/CT6843 help ensure accurate power measurement by delivering high phase accuracy.

3. Evaluating fuel cells, contactless power supply circuity, and other next generation devices

Offset drift* is characterized by minute variations, but those changes can add up over time, resulting in large errors during long-term measurement. The CT6841/CT6843 are designed to minimize offset drift, allowing them to be used in long-term evaluation of fuel cells. Thanks to their broad frequency characteristics, the sensors can also measure DC ripple current. Additionally, the current sensors can be used to measure power transmission efficiency in contactless power supply circuitry thanks to their DC to 1 MHz frequency band.

*Offset drift: A phenomenon that occurs when measuring DC current with a clamp- type current sensor. The zero point gradually shifts relative to its position at the start of measurement due to variations in the temperature of the sensor’s internal circuitry.