Teledyne LeCroy Semiconductor Switch Matrix Mainframes

Teledyne LeCroy Semiconductor Switch Matrix Mainframes

Semiconductor Switch Matrix Mainframes unlike a standalone instrument are switching systems that are used to intelligently connect other instruments to multiple devices. Semiconductor characterization labs, technology development labs, modeling labs, and reliability labs often require several different source and measurement instruments as well as connections to multiple devices. Switching ensures that test connections, and thus measurements, are made with a high degree of repeatability.

Examples of Interconnectivity of Semiconductor Switch Mainframe

• Connects to Semiconductor Characterization System
• Connects to Source Measure Units (SMUs)
• Connects to Semiconductor Parametric Analyzers

Typical Applications for Semiconductor Switch Matrix Mainframes

• Semiconductor device characterization
• C-V Testing. Capacitance-Voltage testing is widely used to determine a variety of semiconductor parameters such as doping concentration and profiles, carrier lifetime, oxide thickness, interface trap density and more.
• Semiconductor reliability testing
• Modeling

Available Switch/Control Cards for Semiconductor Switch Matrix Mainframes

• General purpose voltage and current
• Low current
• High voltage
• RF
• If more measurements are needed, then consider Multi-Purpose Switch Systems which have more than 40 switch/control cards available

Background on Switch and Semiconductor Test Systems

Switch and Semiconductor Test Systems are electronic test systems that use relay switching to connect multiple Devices Under Test (DUTs) to sources and measurement instruments. In some cases, multiple sources and measuring instruments are connected to a single device. Switching allows automating the testing of multiple devices, thereby reducing error and cost.

Designing the switching for an automated test system demands an understanding of the signals to be switched and the tests to be performed. Test requirements can change frequently, so automated test systems must provide the flexibility needed to handle a variety of signals. Even simple test systems often have diverse and conflicting switching requirements. Given the versatility that test systems must offer, designing the switching function may be one of the most complex and challenging parts of the overall system design.

As a signal travels from its source to its destination, it may encounter various forms of interference or sources of error. Each time the signal passes through a connecting cable or switch point, the signal may be degraded. When calculating the overall system accuracy, the engineer must include not only the effects of the switch but all the switching hardware in the system.
The quality of a switch system depends in large part on its ability to preserve the characteristics of the test signals routed through it. For example, when the test signal is a low voltage, the switching system must minimize errors such as offset voltage and IR drops. Leakage current may be a problem for high resistance and low current switching applications. Depending on the type of test signal involved, specific switching techniques must be used to maintain signal integrity through the switching system.

Examples of Switching Types

• Voltage Switching. Applications such as testing batteries, circuit assemblies, thermocouples

• Low Voltage Switching. Millivolts range or less
• High Voltage Switching. Applications such as insulation resistance of cables, printed circuit boards, hi-pot testing
• High Impedance Voltage Switching. Applications such as monitoring electrochemical cells and measuring semiconductor resistivity
• Current Switching. Applications such as testing of power supplies, insulation resistance, capacitor leakage, resistivity of materials, batteries, and semiconductors
• High Current Switching
• Low Current Switching
• Low Current Matrix Switching. Switching of several source measure units (SMUs) to multipin devices or wafer level semiconductor measurements
• Resistance Switching. Applications include measuring the insulation resistance of materials, continuity testing of cables and connectors, contact resistance measurements, and measuring components such as resistors, thermistors, and potentiometers
• Low Resistance Switching. Applications such as contact resistance measurements and cable continuity testing
• High resistance Switching. Applications such as measuring capacitor leakage, multi-conductor cable insulation resistance, and pin-to-pin leakage connectors
• RF and Microwave Switching. Applications include testing of components making up communication systems such as RF integrated circuits (RFICs) and microwave monolithic integrated circuits (MMICs). Typically, these are tested at gigahertz (GHz) frequencies or higher. The main components of a typical test system may include a DC bias source, DC measurement instruments, RF power meter, network analyzer, etc. Automating the test process and improving test efficiency demands integrating RF/microwave and low frequency switching systems into the test system
• Digital Switching. High speed digital signals exhibit RF behavior, which creates need for testing

• Multi-pin devices and components
• Nanotechnology Devices
• Power Supplies
• Semiconductor Devices
• Solar Cells
• Temperature Sensors
• Wafer Level Testing
• Wireless Devices