Compatible devices |
POWER QUALITY ANALYZER PW3198, 3197, 3196 |
Operating environment |
Computer running under Windows XP/Vista (32-bit), or Windows 7 (32-bit/64bit) |
Data loading |
PW3198: Saved binary data
3197: Saved binary data
3196: Saved binary data |
Screen display |
System, Time plot, Event list, Event data, Cursor function, Fluctuation graph of event voltage, Graph of event inrush currnet (at only PW3198, 3197), Integrated power, Demand |
Copy function |
Text data, Screen copy to clip-boad |
Print function |
Screen image, A4/ letter size, preview |
CSV convert function |
Time plot, Event waveform, Fluctuation of event voltage, Inrush current of event (at only PW3198, 3197), Flicker graph (at only PW3198, 3196), Demand, Integrated power |
Report Generation |
Auto output: RMS voltage fluctuation graph, Worst case, Maximum/ minimum value list, Voltage total harmonic distortion percentage graph, All event waveforms, Detailed list of all events, other custom output, or detailed output |
Dimensions |
Approx. 125W x 80H x 32D mm (4.92"W x 3.15"H x 1.26"D) (Cable length: 152 mm, 5.98") |
Only for the PW3198 and 3196 |
[Screen display] Voltage, Transient waveform, Vector, DMM, Harmonic, Zero-, positive- and negative-phase calculations, Flicker graph, Cursor, High harmonic analysis orders (PW3198)
[Integrated Power Calculation] Analysis period: 1 - 35 days (PW3198)/ 31 days (3196), Graph, Consumption/ regeneration value, Cursor measurement, Maximum integrated power
[Demand Calculation] Demand period: 5 - 30 minutes, 1 - 12 hours, Analysis period: 1 - 35 days (PW3198)/ 31 days (3196), Demand graph of consumption value, Average demand, Peak demand, Load ratio
[ITIC Window] Event points are plotted on a tolerance curve (event duration versus swell, dip or interruption voltage percentage), Voltage percentage, Violation count display, Tolerance curve selection
[EN50160 Screen] Classification by overview, harmonic, signaling detail (3196) or measurement results
[Data Download] Via LAN
[Saving settings] User-defined ITIC curves, Classification settings for measurement results, or other |