BK Precision Programmers / IC and RAM Testers
Universal device programmers support a wide variety of programmable devices. They are used to program new chips as well as copy chips for backup and repair. Universal programmers support PROMs, EPROMs, EEPROMs, Flash Memory, PAL, GAL, EPLD, CPLD, FPGA, Microcontrollers, and more. These devices are powerful, versatile, and simple to use. Some are also capable of testing ICs.
IC testers are used to test integrated circuits. They are used to test a wide range of ICs, including TTL and CMOS logic ICs, as well as test dynamic memory and statistic memory. These functions allow users to detect defective ICs. One of the common uses is quality assurance in manufacturing.
EPROM Erasers are also available. They are high intensity UV lamps that efficiently erase EPROM chips in approximately 7 to 15 minutes. These small, durable devices contain a conductive foam pad to protect the chips from harmful electrostatic charges. Also, a UV light indicator and safety interlock switch prevent the user from accidental exposure to ultraviolet radiation.
RAM testers are used to check RAM (Random Access Memory) on devices such as computers. These testers are easy to use as well as affordable and portable. They can be used on a variety of devices.
Programmers/IC and RAM Testers Applications
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Program programmable ICs
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Test TTL and CMOS logic ICs as well as dynamic memory and statistic memory
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Detect defective ICs
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Identify unmarked and house-coded devices
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Detect intermittent and temperature related faults
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Display diagnostic information for individual pins
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Quality assurance in manufacturing
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Copy chips for backup or repair
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Perform various tests to establish memory quality
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Perform tests under allowable voltage deviations from the recommended VDD setting
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Identify various operational parameters of the device, including different bursts lengths and CAS latency settings
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Test data retention during voltage variation between read and write
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Reveal adjacent cell interference problems
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Test memory with endless pattern changes
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Identify the faulty bits within a defective module
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Check all the wiring and all the memory cells
Key Features of Programmers/IC and RAM Testers to Consider
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Stand-alone or remote PC-Controlled
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Project load and save features
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Synchronous and asynchronous operations supported for two or more connected programming units
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File download and upload
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EPROM Auto ID, device auto-sensing, and device insertion check
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Split programming for memory devices
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AUTO command for multi-chip programming
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USB interface for high-speed data transmission
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Supports Windows 98/Me/2000/NT/XP
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Built-in editor for both buffer date and test vectors
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Automatically configures for host parallel port(LPT1,LPT2,LPT3)
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External AC power transformer
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Approved by CE laboratory to meet CE requirement
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Built-in protection circuits prevents damage to programmer and programmable ICs
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The device's SPD can be conveniently viewed, edited and programmed.
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Snap-in expansion ports for a variety of add-on adapters
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Features a Zero Insertion Force socket for testing 168-pin DIMMs
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Supports numerous types of memory devices, including DDR, SO DIMMs, old SIMMs, individual chips, and more
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All chips are tested simultaneously to yield a faster test and to enable the instrument to detect errors that are caused by interference among the chips on the module.
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Automatic EDO, Fast Page, Static Column, and other mode analysis