| Vitrek V7X Test Step Specifications |
| |
V70 |
V71 |
V73 |
V74 |
V75 |
V79 |
| AC Hipot |
• |
• |
• |
• |
• |
|
| DC Hipot |
|
• |
• |
• |
• |
|
| IR |
|
|
• |
• |
• |
|
| Ground Bond |
|
|
|
• |
|
• |
| Low Resistance |
• |
• |
• |
• |
• |
• |
| 16 Ch HV Scanner |
|
|
|
|
• |
|
| ACW Test Steps |
| Voltage |
10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
1%+5V accuracy under all allowed loading conditions |
| Max. Load |
20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V |
| Leakage Accuracy |
DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth
DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)
DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution) |
| ARC Limit |
Disabled or up to 30mA (1mA resolution) |
| Ramp |
0 to 99.9sec (0.02sec resolution) |
| Dwell |
0.1 to 9999sec (0.1sec resolution) or user terminated |
| Shutdown |
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms |
| User Settings |
Voltage Level
Frequency
DUT Isolated/Grounded
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure |
| DCW Test Steps |
| Voltage |
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
1%+5V accuracy under all allowed loading conditions |
| Max. Load |
2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance
3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance |
| Leakage Accuracy |
DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)
DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)
Otherwise : 1%+20µA (10µA resolution) |
| ARC Limit |
Disabled or up to 30mA (1mA resolution) |
| Ramp |
DUT resistive : 0.1 to 99.9sec (0.02sec resolution)
DUT capacitive : 1.0 to 99.9sec (0.02sec resolution) |
| Dwell |
0.1 to 9999sec (0.02sec resolution) or user terminated |
| Ramp Down |
0sec or as defined for ramp |
| Discharge Internal |
50KΩ discharge load and 0.03µF capacitive energy |
| Shutdown |
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs |
| Leakage Limit (if enabled) |
within 100ms
ARC Limit (if enabled) : within 1ms |
| User Settings |
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure |
| IR Test Steps |
| Voltage |
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
2.5%+5V accuracy under all allowed loading conditions |
| Lowest IR |
3000V : 10MΩ |
| Highest IR |
DUT resistive, isolated : 90MΩ per V
DUT capacitive, isolated : 2MΩ per V
DUT grounded : 0.1MΩ per V |
| Max Capacitance |
3000V : 0.03µF
5mA maximum charging current |
| IR Accuracy |
<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution) |
| Test Time |
0.1 to 9999sec (0.1sec resolution) or user terminated |
| Test Delay |
0.0 to 9999sec (0.1sec resolution) |
| Discharge |
Internal 50KΩ discharge load and 0.03µF capacitive energy |
| Shutdown |
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
IR Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms |
| User Settings |
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. IR Limit
Max. IR Limit (can be disabled)
Ramp Period
Dwell Period
Delay Period
Dwell End On Pass/Fail/Time/Steady or Rising
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure |
| CONT Test Steps |
| Method |
2 terminal measurement (DC) |
| Test Current |
<10.5mA |
| Test Voltage |
<4.15V |
| Range |
0Ω to 60KΩ |
| Accuracy |
<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)
<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution) |
| Test Time |
0.06 to 9999sec (0.02sec resolution) or user terminated |
| CONT Leakage |
DCW or IR test steps : <0.1µA
ACW test steps : <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded) |
| User Settings |
Min. Limit (can be disabled)
Max. Limit (can be disabled)
Resistance Offset
Test Time
Stop/Continue Sequence on Failure |
| GB Test Steps |
| Method |
4 terminal measurement (AC) |
| Current |
1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%
3%+10mA accuracy |
| Compliance |
>4.5Vrms at all currents |
| Open Circuit |
<10Vpk |
| DUT Ground |
DUT may be isolated from ground or be grounded. If grounded, must be within 3Vpk of V7X ground. |
| Range |
Max resistance determined by max compliance and test current |
| Accuracy |
6.5A : 2.5%+1mΩ (0.1mΩ resolution) |
| Test Time |
≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated
>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated
>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle) |
| GB Leakage |
DCW or IR test steps : <1µA
ACW test steps : <5µA per KV setting (DUT isolated), <10µA (DUT grounded) |
| User Settings |
Current Level
Frequency
Min. Limit (can be disabled)
Max. Limit
Resistance Offset
Test Time
Stop/Continue Sequence on Failure |
| PAUSE Test Steps |
| Pause Delay |
0.1 to 9999sec (0.02sec resolution) |
| User Settings |
Pause Delay |
| HOLD Test Steps |
| Timeout |
0.1 to 9999sec (0.02sec resolution) or none |
| User Settings |
Timeout (can be disabled)
Message (two lines) |
| SWITCH Test Steps |
| Execution Time |
<0.05sec per switch (Model V75)
<0.04sec per Switch unit + switch unit switching time (see 964 specifications) (All other models) |
| User Settings |
Sub Type (Model V75)
Relay states for each relay in the specified Sub Type (Model V75)
Relay states for each relay in each switch unit (4 max switch units) (All other models) |
| Dimensional |
137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)
V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping
V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping
Dimensions and weights shown are nominal |
| Environmental |
| Storage Environment |
-20 to 75C (non-condensing) |
| Operating Environment |
0 to 40C, <85% RH (non-condensing), Pollution Degree 2 |
| Operating Altitude |
0 to 10000ft ASL, reduced maximum voltage capability above 5000ft |
| Power Source |
Internally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum |