| DC Dielectric Tests (DCW, DCIR, DCez, DCCAP) |
| DC Output Voltage |
2V to 6500V (951i & 952i)
2V to 11000V (953i,954i & 955i) |
| Resolution |
0.1V up to 999.9V, 1V above |
| Accuracy |
0.25% + 0.5V ( 1 year 23°C ± 3°) |
| DC Current Sourcing |
50mA max, 25mA above 6000V (951i & 952i)
30mA max, 20mA above 6000V, 10mA above
7500V, 5mA above 9000V (953i, 954i, 955i) |
| Ramp Time |
0.01 to 9999sec, 0.01sec resolution
or 0.1 to 50000V/sec, 0.1V/sec resolution |
| Dwell Time |
0.02 to 9999 seconds or user terminated, 0.01sec resolution |
| Discharge |
25mA max in solid-state constant current discharge mode, selectable same as ramp rate or ramp to next level if next step is DCW, DCez or DCIR |
| DC Leakage Current |
Measurement Range: 0 to +/-200mA, |
| Resolution |
4 digits (9999 counts) down to 100pico-amp |
| Accuracy |
0.25% + 0.5nA + ½ digit ( 1 year 23°C ± 3°) |
| Min & Max Current limits |
Selectable for Ramp and Dwell 100 pico-amps and up |
| Measurement Period |
1 power line cycle (50/60Hz) |
| Insulation Resistance (IR) |
Test modes include: End on pass reading, end on fail or end on dwell timer |
| Test Voltage |
5% Accuracy* Max resistance |
10% Accuracy* Max resistance |
20% Accuracy* Max resistance |
| 500V |
50GΩ |
100GΩ |
200GΩ |
| 1000V |
100GΩ |
200GΩ |
400GΩ |
| 2500V |
250GΩ |
500GΩ |
1TΩ |
| 5000V |
500GΩ |
1TΩ |
2TΩ |
| 10000V |
1TΩ |
2TΩ |
4TΩ |
| *Above uncertainties are approximate, IR accuracy is determined by adding output voltage accuracy to current measurement accuracy in percentages. |
|
| AC Dielectric Tests (ACW, ACIR, ACez, ACCAP) |
| AC Output Voltage |
20V to 6000V RMS (951i, 952i, 953i, 954i)
50V to 10,000V RMS (955i)
100V to 30,000V RMS (option AC-30) |
| Resolution |
0.1V up to 999.9V, 1V above |
| Accuracy |
0.5% + 1.5V (+ 0.01% per Hz above 100Hz) |
| |
Decrease max output voltage by 0.1% per Hz, above 100Hz |
| |
Decrease max voltage by 12.5V/mA loading (25V/ma 955i) |
| AC Current Sourcing |
50mA RMS max (951i, 952i, 953i, 954i)
30mA RMS max , (955i)
200mA RMS with option AC-2 (2KVAC RMS max output)
10mA RMS Max with AC-30 option |
| Output Frequency |
Digitally synthesized, low distortion sinewave
20Hz to 500Hz, standard or AC-2)
40Hz to 500Hz, (955i)
0.1% accuracy, 0.1Hz resolution (1Hz above 99.9Hz) |
| Ramp Time |
0 to 9999sec, 0.01sec resolution or 0.1 to 100000V/sec, 0.1V/sec resolution |
| Dwell Time |
0.02 to 9999 seconds or user terminated, 0.01sec resolution |
| Accuracy |
0.05% + 20mS |
| Ramp Down |
Selectable same as ramp time or ramp to next level if next test step is an ACV test type |
| AC Leakage Current |
Measurement Range: 0 to +/-200mA RMS |
| Resolution |
4 digits (9999 counts) down to 100pico-amps |
| Accuracy |
0.5% + 10nA (add 0.005% per Hz above 100Hz) Selectable min & max limits for Ramp & Dwell, from 100 pico amps up Measurement Period: 1 power line cycle (50/60Hz) |
| Phase Measurement |
Total RMS current, In-phase current, Quadrature current (reactive/out-of-phase) |
| Accuracy |
0.01° per Hz, relative to output voltage |
| AC Insulation Resistance |
Test modes include: End on pass reading, end on fail or end on dwell timer |
| Test Voltage (50/60Hz) |
10% Accuracy* Max resistance |
20% Accuracy* Max resistance |
| 500V |
5GΩ |
10GΩ |
| 1000V |
10GΩ |
20GΩ |
| 2500V |
25GΩ |
50GΩ |
| 5000V |
50GΩ |
100GΩ |
| 10000V (955i only) |
100GΩ |
200GΩ |
| *Approximate uncertainties, ACIR accuracy is determined by adding output voltage accuracy to in-phase current accuracy in percentages. |
|
| Ground Bond Tests (GB, GBez - 952i, 954i, 959i) |
| Test Current |
0.1 to 40A RMS, 0.001A resolution |
| Accuracy |
0.5% + 5mA accuracy (add 0.005% per Hz above 100Hz) |
| Test Frequency |
40Hz to 500Hz |
| Resolution |
0.1Hz (1Hz above 99.9Hz) Accuracy: 0.1% accuracy |
| Waveform |
Digitally synthesized, low distortion sinewave |
| Measurement Configuration |
4-Terminal Kelvin |
| Compliance Voltage |
6.5V RMS, may be user limited to a lower level with 0.01V resolution |
| Resistance Range |
6.5 ohms at 1A decreasing to 162.5 milli-ohms max at 40A |
| Max load impedance |
10 ohms |
| Ramp Time |
0 to 9999sec, 0.01sec resolution |
| Accuracy |
(1% + 0.1sec) accuracy |
| Dwell Time |
0.02 to 9999sec or user terminated, 0.01sec resolution |
| Accuracy |
0.05% + 20ms |
| Ramp Down |
Fast (35mS), same rate as ramp up or may be skipped if next test step is a ground bond test |
| Voltage Sense |
Range: 0 to 8 v rms |
| Resolution |
4 digits down to 10uV Accuracy: 0.5% + 30uV |
| Phase Measurement |
RMS, In-phase and Quadrature measurements 0.01° per Hz phase relative to test current |
| Low Resistance Measurement |
| Measurement Range |
0 to 150Kohm (999.9mΩ to 99.99KΩ, 149.9KΩ in 7 ranges) |
| Resolution |
4 digits, 100µΩ on 1ohm range |
| Test Current |
55mAdc constant current up to ≈ 91Ω, 5VDC constant V above |
| Accuracy (4-wire) |
0.5% + 0.002ohm + ½ digit up to 30K ohm
1.5% + ½ digit above 30K ohm
5% + 1 digit from 100K to 150K ohm
Add 20mΩ for 2 -wire |
| Line Leakage Current & Voltage Measurement (Models 951i - 955i only) |
| Voltage Measurement |
0 to ± 8KVDC 6KV RMS AC (951i & 952i)
0 to ± 11KVDC 8KV RMS AC (953i & 954i)
0 to ± 11KVDC 10KV RMS AC ( 955i) |
| Resolution |
0.1V, 1 V above 999.9V |
| DC Accuracy |
0.25% + 0.5V |
| AC Accuracy |
0.5% + 1.5V |
| Leakage Current |
0 to ± 200mA DC or RMS AC |
| Resolution |
4 digits (9999 counts) down to100pico-amps |
| DC Accuracy |
0.25% + 0.5nA |
| AC Accuracy |
0.5% + 20nA |
| Test Results Test Time |
0.02 to 9999 sec Last, Minimum, Average & Max V& A reading plus arc current |
| Pulse Mode (Flash) Test (Option PMT-1 available on models 951i, 952i, 953i, 954i) |
| Test Waveform |
Trapezoidal (Selectable positive polarity, negative polarity or bi-polar) |
| Ramp Up/Down Time |
1ms (0.5ms for option AC2) to 30mS with 0.1ms resolution |
| Dwell Time |
1ms (0.5ms for option AC2) to 30mS with 0.1ms resolution |
| Test Voltage |
50V to 8000V (20V to 2750V with option AC-2) |
| Resolution |
0.1V up to 999.9V, 1V above |
| Accuracy |
0.25% + 1.5V |
| General Specifications |
| Test Lead Safety Sense |
TLSS™ Technology continuously verifies that test leads are properly connected prior to and during HV, 4-wire Low Ohms and Ground Bond testing |
| Arc Detection Sensitivity |
User selectable 3 microseconds to 30 microseconds. |
| Dwell Time Accuracy |
Accuracy: 0.05% + 20mS |
| RS232 Interface |
Digital I/O, VICL: Vitrek auxiliary unit control loop
Remote Interface Option "IF-3":
GPIB - IEEE-488.2 Subset compatible
RS232C - 1200, 2400, 4800, 9600 Baud rate selectable
Parallel - IBM/Centronics compatible |
| Accuracy |
Stated specifications are bipolar and apply for one year within 5°C from calibration temperature (20 to 25°C). |
| Operating Temperature |
0 C to 50° C |
| Humidity |
90% RH, 0 to 40° C |
| Power |
115/230 VAC + 10%, 350 VA Max |
| Dimensions |
89mm H x 432mm W x 457mm D (3.5" H x 17" W x 18" D) |
| Weight |
9Kg (18 lb.) Net / 18Kg (25 lb.) shipping (951i, 953i, 959i)
14Kg (28 lb.) Net / 18Kg (35 lb.) shipping (952, 954i, 955i) |