State-of-the-art Acquisition System

The CSA8200 and TDS8200 Sampling Oscilloscopes are comprehensive acquisition and measurement instruments for research, design evaluation, and manufacturing test in the fields of datacom and telecom components, transceiver subassemblies, and transmission systems, computer and storage based high speed electrical serial data, semiconductor test, TDR-based impedance characterization, and other applications requiring bandwidths into tens of GHz.

The 8200 Series generates measurement results, not just raw data, with time and amplitude histograms, mask testing, and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude measurements for both RZ, and NRZ signals. Compliance based mask testing of high speed optical and electrical communications, and computer standards such as SDH/SONET, Ethernet, Fibre Channel is included. Color-grading and gray-scale grading of waveform data adds a third dimension, sample density, to signal acquisition and analysis. The industry’s first variable persistence database allows exact data and measurement aging on all of the functions, and facilitates dynamic update on DUTs under adjustment.

The 8200 Series combines very low timebase jitter with very fast acquisition rate. It can acquire the data in several time windows, each with its own acquisition parameters and display window. It provides a comprehensive suite of measurement capabilities to evaluate the data, as well as acquisition math and waveform math functionality to further process the results with histograms, mask testing, and statistics.

The 8200 Series provides great data storage flexibility with four 3D databases available simultaneously; the databases offer an industry-first variable persistence with accurate data ageing. Color-grading of waveform data adds a third dimension, sample density, to signal acquisitions and analyses.

The CSA8200 and TDS8200 models share the same capabilities; either model, for example, may be configured with any combination of sampling modules.

Powerful Jitter, Noise and BER Analysis Capabilities

When equipped with the available 80SJNB Advanced Jitter, Noise, and BER Analysis software, the 8000, 8000B, or 8200 Series oscilloscopes become a comprehensive serial data signal impairment characterization tool. 80SJNB speeds up the identification of the underlying causes of both horizontal and vertical eye closure through separation of both jitter, and noise. With its unique insight into the constituent components of both jitter and noise, 80SJNB provides highly accurate and complete BER extrapolations and eye contour.

When you combine Jitter, Noise, and BER Analysis with the 8000 Series’ modular flexibility , uncompromised performance, and unmatched signal fidelity you get the ideal solution for next generation high-speed serial data design and validation, from 1 Gb/s to 60 Gb/s.

Modularity and Flexibility

The CSA8200 and TDS8200 oscilloscopes support a large and growing family of electrical and optical plug-in modules. This modular architecture lets you configure the instrument to meet your needs today, and protects your investment by allowing you to add additional modules in the future. With its differential clock recovery module, the instrument can be used for acquisition of differential electrical signals even when there is no trigger available.

Electrical modules are available with bandwidths up to 70 GHz. Differential and single-ended passive hand probes are available with bandwidths up to 18 GHz. An adapter for the popular TekConnect® probing system brings the performance of Tektronix’ state-of-the-art high impedance differential and single ended probes to the 8200 Series Sampling Oscilloscope. A differential electrical clock recovery module covering most popular data rates between 50 Mb/s and 12.6 Gb/s is also available.

Optical modules provide complete optical test solutions for both telecom (SONET/SDH), and Datacom (Ethernet, and Fibre Channel) applications with data rates from 155 Mb/s to 43 Gb/s. Integrated clock recovery is also available on most optical modules.

Extremely Low Trigger Jitter, Flexible Signal Acquisition Solution

The 82A04 Phase Reference Module extends the capability of the 8200 Series Sampling Platform by providing extremely low jitter/low drift sample position information to the mainframe. This sample position information is based on the phase of a clock the user provides to the 82A04 input.

The benefits of using the sample position information based on a clock signal are two-fold —an extremely low Jitter of <200 fsRMS (typical), and the possibility of a trigger-less acquisition. Typical application is the acquisition and analysis of very high speed optical and electrical signals in high-speed communication devices and systems, and similar areas.

The 82A04 together with the CSA/TDS8200 implements the phase reference timebase functionality in a novel way, giving the user the freedom to select from timebase and acquisition modes without compromises; any phase-reference frequency within the operating range is accommodated, and even advanced features, such as FrameScan®, remain available. The separate DSP per acquisition slot architecture of the CSA/TDS8200 enables the acquisition rate in the phase reference mode to reach over 40 kS/s*1.

*1 Typical performance, some settings will lower the throughput.

Superior Performance

With its industry-best horizontal timebase stability, signal sensitivity, and noise performance, the 8200 Series ensures the most accurate representation of your signal.

The 8200 Series’ True differential TDR with 28 ps reflected rise time enables complete TDR/TDT/Crosstalk measurements on complex assemblies. With system capacity of up to four dual channel modules, four differential signal pairs can be driven simultaneously. For TDR probing, the P8018 single-ended probe and the new P80318 differential probes support full TDR bandwidth, while the 80A02 module provides protection from damage by electrostatic discharge. These features enable even measurements performed in the manufacturing environment to achieve highly precise results, while protecting the TDR module itself.

Add the available IConnect® software and you have an efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter and eye diagram compliance testing, and fault isolation. IConnect provides an integrated simulate-and-compare link between SPICE/IBIS simulators, and TDR/T or VNA S-parameter measurements. This capability allows the designer to quickly extract and validate gigabit interconnect models, and to predict eye-diagram degradation, jitter, losses, crosstalk, reflections and ringing in PCBs and flexboards, packages, sockets, connectors, cable assemblies, and at the input die capacitance

The CSA/TDS8200 implements the popular FrameScan® acquisition mode, which can be used for scanning of the data bits to isolate pattern dependent effects, viewing sub-harmonic interference, or capturing the sequence leading to a mask violation. Innovative features such as averaging of eye diagrams allow the user to view an averaged eye diagrams for applications such as evaluating Inter-Symbol-Interference or separating pattern related Deterministic Jitter from Random Jitter.

8200 Series Sampling Oscilloscope Platform

The 8200 Series is built on Tektronix’ sampling oscilloscope platform that combines familiar Microsoft Windows 2000-based PC technologies with world-class waveform acquisition technology. This platform provides a wide array of standard instrumentation and communications interfaces (such as GPIB, Parallel Printer Port, RS-232-C and USB Serial Ports, and an Ethernet LAN connection). In addition, the platform includes several mass storage devices (floppy disk, removable hard drive, and CD-ROM). Gated triggering, a feature that allows the exclusion of selected time periods from being measured, is also available.

Because the system supports an Open Windows environment, new levels of data analysis can be performed directly on the instrument using commercially available software packages. Additionally, TekVISA™, a standard software accessory, allows the instrument to be placed under the control of software applications (for example, LabVIEW, LabWindows, Visual Basic, Microsoft Excel, C, etc.) running on the instrument, or on external PC workstations network connected to the instrument, without the need for a GPIB hardware interface. Plug & Play drivers for LabVIEW and other programs are also supplied.

8200 Series Sampling Oscilloscope Optical Modules

80C02 High-performance Telecom Optical Sampling Module

The 80C02 module is optimized for testing of long-wavelength (1100 to 1650 nm) signals at 9.953 Gb/s (SONET OC-192/SDH STM-64). With its high optical bandwidth of 28 GHz, it is also well suited for high-performance optical component testing. The 80C02 can be configured with integrated clock recovery that supports 9.953 Gb/s standards. A superset of this module's functionality has been integrated into the flexible new 80C11 module.

80C07B Multi-rate, Telecom/Datacom Optical Sampling Module

The 80C07B module is a broad wavelength (700 to 1650 nm), single mode/multi mode, multi-rate, high sensitivity optical sampling module optimized for the testing of telecom and datacom signals. Support for OC-48/STM-16 (2.488 Gb/s), InfiniBand 2 GbE (2.500 Gb/s), is standard; the user may select two additional reference receiver filters from the following list to be included in the product: OC-3/STM-1 (155 Mb/s), OC-12/STM-4 (622 Mb/s), Fibre Channel (1.063 Gb/s), GbE (1.250 Gb/s), or 2G Fibre Channel (2.125 Gb/s). With its amplified O/E converter design, this module provides excellent signal-to-noise performance, allowing users to examine low-power optical signals. The 80C07B can be configured with integrated multi-rate clock recovery that supports rates between 155 Mb/s and 2700 Mb/s

80C08C Multi-rate, Datacom & Telecom Optical Sampling Module for 10 Gb/s

The 80C08C module is a broad wavelength (700 nm to 1650 nm), single mode/multi mode multi-rate optical sampling module providing datacom rates testing for 10 GbE applications at 9.953 Gb/s (10 G BASE-W), 10.3125 Gb/s (10 G BASE-R), 10.51875 Gb/s (10 G Fibre Channel), 10 GbE FEC (11.1 Gb/s), and telecom rates testing for STM-64/OC-192 (9.953Gb/s), ITU-T G.975 FEC (10.664 Gb/s), ITU-T G.709 (10.709 Gb/s). With its amplified optical-to-electrical (O/E) converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine low-power level optical signals. The 80C08C can be configured with a number of integrated clock recovery solutions, including continuous rate clock recovery from 9.8 Gb/s to 12.5 Gb/s

80C10 65 GHz 40 Gb/s Optical Sampling Module

The 80C10 module provides long wavelength, single-mode fiber support at 1310 nm and 1550 nm, and integrated and selectable reference receiver filtering for conformance testing at 39.813 Gb/s (OC-768/STM-256) and 43.018 Gb/s (43 Gb/s ITU-T G.709 FEC) rates. In addition to the filter rates, the user may also choose selectable bandwidths of 65 GHz, or 30 GHz for optimal noise versus bandwidth performance for accurate signal characterization.

80C11 High-performance Multi-rate Optical Sampling Module

The 80C11 module is optimized for testing of long-wavelength (1100 to 1650 nm) signals on single-mode fiber, for all telecom and datacom rates around 10 Gb/s. Additionally, the high optical bandwidth of 30 GHz (typical) is well suited for general-purpose high-performance optical component testing. The 80C11 can be configured with integrated continuous rate clock recovery from 9.8 to 12.5 Gb/s that supports all current rates in the 10 Gb/s band (9.953 Gb/s, 10.3125 Gb/s, 10.51875 Gb/s, 10.664 Gb/s, 10.709 Gb/s, and others).

80C12 High flexibility Multi-rate Optical Sampling Module

The 80C12 module is a broad wavelength (700 to 1650 nm), single mode/multi mode, multi-rate, high sensitivity optical sampling module optimized for the testing of telecom and datacom signals. Several reference receiver filter options are available. Filter selections include OC-3/STM-1 (155 Mb/s), OC-12/STM-4 (622 Mb/s), Fibre Channel (1.063 Gb/s), 2G Fibre Channel (2.125 Gb/s) and 4G Fibre Channel (4.25 Gb/s) , GbE (1.250 Gb/s), OC-48/STM-16 (2.488 Gb/s), InfiniBand 2 GbE (2.500 Gb/s, 10 GbE by four (10GBASE-×4 at 3.125 Gb/s), as well as 10GFC by four at 3188 Gb/s. Clock recovery for the 80C12 is provided by the 80A05. The 80C12 provides an electrical output that can be used as an input for the 80A05 Electrical Clock Recovery module.

8200 Series Sampling Oscilloscope Electrical Modules

80E01 50 GHz Electrical Sampling Module

The 80E01 is a single channel 50 GHz bandwidth sampling module with a measured rise time of 7.0 ps or less. Displayed noise is typically 1.8 mVRMS. The front-panel connector is female 2.4 mm, and an adapter is provided (2.4 mm male, to 2.92 mm female) to maintain compatibility with SMA connector systems.

80E02 12.5 GHz Low-noise Electrical Sampling Module

The 80E02 is a dual-channel 12.5 GHz sampling module specifically designed for low-noise measurements in digital communications and device characterization applications. It provides measured rise time of 28 ps and typically 400 µVRMS of displayed noise. The 80E02 is the ideal instrument for low-power applications. Common applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits, making accurate statistical measurements of signal noise and signal timing jitter, and obtaining stable timing measurements of fast digital ICs.

80E03 20 GHz Electrical Sampling Module

The 80E03 is a dual channel 20 GHz sampling module. This sampling module provides an acquisition rise time of 17.5 ps.

80E04 20 GHz TDR Electrical Sampling Module

The 80E04 is a dual-channel 20 GHz sampling module with a TDR step generator for each channel. The TDR step generators operate in either positive or negative polarity, allowing for simultaneous operation for true differential and true common mode measurements. The 17 ps (typical) incident rise time and 28 ps (typical) reflected rise time enable superior timing and special resolution. 80E04 acquisition capabilities match those of the 80E03 module.

80E06 70+ GHz Electrical Sampling Module

The 80E06 is a single channel 70+ GHz (typical) sampling module with 5 ps calculated rise time. Typical RMS noise is 2.0 mV. This sampling module provides a 1.85 mm (Type V) front-panel connector, and a precision adapter to 2.92 mm with a 50 O SMA termination.

Extender Cables

1 meter and 2 meter length extender cables are available for remote operation of the electrical sampling modules. Use of extender cables allows the electrical module to be located near the DUT, and minimizes cable length between the DUT and the electrical module.

8200 Series Sampling Oscilloscope Accessory Modules & Probes

80A02 EOS/ESD Protection Module

The 80A02 EOS/ESD Protection module protects the sampling bridge of Tektronix electrical sampling module inputs from damage by electrostatic charge. The 80A02 is intended for use in applications such as electrical TDR circuit board testing and cable testing where large static charges can accumulate on the DUT.

The 80A02 can be powered in two ways —by plugging it into one of four small plug-in slots on the CSA/TDS8200 oscilloscope, or by using a SlotSaver adapter cable. The unit provides a front panel SMA connector for connecting the SMA test cable or probe signal from the DUT. The 80A02 passes the acquired DUT signal to a connected electrical sampling module input for measurement after an actuating control signals the 80A02 that the DUT has been discharged.

The 80A02 provides superior EOS/ESD protection when used with the P80318 and P8018 high bandwidth differential and single-ended handheld probes.

P80318 Differential Handheld TDR Probe

The P80318 is an 18 GHz 100 O input impedance differential TDR hand probe. This probe enables high fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P80318 probe also includes two precision SMA cables with parallel control lines that provide the 80A02 the control for EOS/ESD protection.

P8018 Single-Ended Handheld TDR Probe

The P8018 Handheld TDR Probe is a greater than 20 GHz, 50 O input impedance, single-ended passive probe that provides a high performance solution for electrical sampling, TDR circuit board impedance characterization, and high-speed electrical signal analysis applications. The P8018 probe also includes a precision SMA cable and parallel control line that provides the 80A02 the control for EOS/ESD protection.

80A03 TekConnect® Probe Interface Module

The 80A03 enables the use of two Tektronix P7000 Series probes on the CSA/TDS8200 Series sampling oscilloscopes. The 80A03 plugs into any of the mainframe’s four small sampling module slots. The 80A03 is powered through the oscilloscope and requires no user adjustments or external power cords. An electrical sampling module can be plugged directly into the slot on the 80A03 to provide the optimum signal fidelity and a short electrical path. The signal from the probe can also be connected to another input such as the mainframe trigger input, or a module plugged into the mainframe.

The 80A03 enables design engineers to access the benefits of Tektronix' industry-leading active and differential probes for measuring signals on SMD pins, and other challenging circuit features.

82A04 Phase Reference Module

The 82A04 module enables a sub-200 fsRMS extremely low jitter timebase on the 8200 Series mainframes. This capability requires the use of a user provided reference clock source. Input frequency range of the reference clock is continuous from 2 to 60+ GHz. An external filter may be required for non-sinusoidal clocks below 8 GHz. The module operates in any small module slot. The 82A04 supports both the Triggered mode of operation, which is similar to traditional acquisition, and an un-triggered Free Run mode in which all timing information comes from a customer-supplied clock (no trigger signal necessary). When an external clock is not available the module can accept the clock signal from the clock recovery output of the 80Cxx modules, as well as from the 80A05 clock recovery module.

80A05 Electrical Clock Recovery Module

The 80A05 Electrical Clock Recovery Module provides clock recovery for electrical signals and internal triggering on the recovered clock. The module recovers clock from serial data streams for all of the most common electrical standards from 50 Mb/s to 12.6 Gb/s. Option 10G adds support for standard rates up to 12.6 Gb/s. The module accepts either single-ended or differential signals as its input. The signal is then split with half of the signal being routed to clock recovery circuitry, and half being routed out the front of the module to be used as input to an electrical module.

This module also serves as the clock recovery module for the 80C12. The 80C12 has an electrical signal output that may be routed to the 80A05 for clock recovery purposes.

80A06 PatternSync Trigger Module

The 80A06 PatternSync Trigger Module extends the capability of the CSA/TDS8200 mainframe by creating a pattern trigger from any data-related clock: a recovered clock, user supplied clock, sub-rate clock, or super-rate clock. The module is required for advanced jitter, noise, and BER analysis using the 80SJNB software package.

SlotSaver Small Module Extender Cable

This cable can be used to power and operate one 80A01, 80A02, or 80A06 accessory module, eliminating the need to consume a small form factor mainframe slot. The SlotSaver extender cable plugs into the ‘Trigger Power’ connector on the mainframe, or into the ‘Probe Power' connector on most electrical sampling modules.

8200 Series Sampling Oscilloscope Application Software

80SJNB Advanced Jitter, Noise, and BER Analysis

80SJNB is a comprehensive jitter, noise, and bit error ratio (BER) analysis application for serial data signal impairment characterization. 80SJNB is the first oscilloscope-based application software package that goes beyond jitter analysis to provide jitter, noise, and BER analysis for today’s high-speed serial data rates from 1 Gb/s to 60 Gb/s. 80SJNB speeds up the identification of the underlying causes of both horizontal and vertical eye closure through separation of jitter and noise. With its unique insight into the constituent components of both jitter and noise, 80SJNB provides highly accurate and complete BER extrapolation and eye contour analysis.

80SICON IConnect® Interconnect Analysis and Modeling Software

IConnect® software is the efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter and eye diagram compliance tests, and fault isolation. IConnect provides integrated simulate-and-compare link between SPICE/IBIS simulators and TDR/T, and allows the designer to quickly extract and validate gigabit interconnect models and to predict eye-diagram degradation, jitter, losses, crosstalk, reflections and ringing in PCBs and flexboards, packages, sockets, connectors, cable assemblies, and at the input die capacitance.

IConnect provides simple and efficient algorithms for computing single ended and differential S-parameters, insertion and return loss from TDR/T measurement, which enable very cost-effective and efficient specification compliance testing for gigabit interconnects. Eye mask, eye opening, and jitter measurements allow easy eye analysis. IConnect true impedance profile improves the oscilloscope resolution and accuracy, and helps locate failures more easily.

80SICMX IConnect Interconnect MeasureXtractor™ Model Extraction Software

IConnect MeasureXtractor™ automatic model extraction tool then converts TDR/T or S-parameters into an exact interconnect model, compatible with any SPICE or IBIS simulator. These models then allow the designer to quickly perform system level analysis of the interconnect link with transmitter and receiver. 80SICMX includes both IConnect and MeasureXtractor.

80SSPAR IConnect S-Parameter

IConnect S-parameters is the efficient and easy-to-use tool for digital designers, operating at gigabit speeds, to perform single-ended, differential, and mixed mode S-parameter measurements of their interconnects, measure insertion loss, return loss, and frequency domain crosstalk, and conduct interconnect electrical compliance testing. IConnect S-parameters is the most cost-efficient and fast-throughput approach for S-parameter measurements in digital design, signal integrity analysis, and interconnect compliance testing, providing 50% cost savings compared to traditional S-parameter measurement equipment of the same bandwidth, and dramatically speeding up the measurements. The simplicity of S-parameter calibration using a reference waveform (open, short, or through), or an optional 50 O load waveform make the measurement itself, fixture de-embedding, and moving the reference plane a snap.