The SDS6000L series supports eye diagrams and jitter analysis/measurement. It can automatically extract the embedded reference clock from serial data and create an eye diagram. Measurement on multiple eye/jitter parameters is provided and mask testing of eye diagrams is supported.

Eye Diagram

• Source: CH1 ~ CH8
• Clock recovery: Constant frequency, PLL
• Measure: Eye height, “1” level, “0” level, Eye amplitude, Eye width, Eye crossing, Average power, Q factor, TIE
• Mask Test: Supported

Jitter Analysis

• Source: CH1 ~ CH8
• Clock recovery: Constant frequency, PLL
• Measure: Period, Frequency, +Width, -Width, +Duty cycle, -Duty cycle, Cycle-cycle jitter, Cycle-cycle +width, Cycle-cycle -Width, Cycle-cycle +Duty cycle, Cycle-cycle -Duty cycle, Bit Rate, Unit interval
• Jitter decomposition: TIE, RJ, DJ, DCD, DDJ, PJ, TJ@BER Statistics: Histogram, Track, Spectrum