| Rohde & Schwarz RTO6-K12 Specifications |
| R&S RTO6-K12 Jitter Analysis |
| General Description |
The R&S RTO6-K12 jitter analysis option extends the functionality of the standard R&S RTO64 firmware with a suite of measurement, analysis, and visualization tools for signal integrity analysis and jitter characterization. |
| Waveform Measurements |
Category |
Jitter |
| Measurement functions |
Cycle-to-cycle jitter, N-cycle jitter, cycle-to-cycle width, cycle-to-cycle duty cycle, time-interval error, data rate, unit interval, skew delay, skew phase; the standard time measurements period, frequency, and setup/hold are also available in the jitter category for convenience |
| Track |
Measurement results displayed as a continuous trace that is time-correlated to the measurement source; applicable to time measurements from categories "jitter" and "amplitude and time"; track trace may be used as a source for cursor measurements, automatic measurements, math waveforms, and reference waveforms |
| Waveform Math |
FFT on track |
FFT spectrum of the track trace of measurement results |
| CDR transform |
Recovers clock timing from source waveform with software CDR and generates synthetic clock waveform that is time-correlated to source |
| Software Clock Data Recovery (CDR) |
Number of CDR instances |
Up to 2; independently configurable |
| Algorithm |
Phase-locked loop (PLL), constant frequency |
| Configuration |
Nominal bit rate, PLL order (first or second), PLL loop bandwidth, PLL damping factor, initial phase alignment, result selection during the initial synchronization |
| Mask Testing with Eye Mask Assistant |
Primary mask shape |
| Type |
Diamond, square, hexagon, octagon |
| Dimensions |
Main and secondary height, main and secondary width, depending on the selected shape |
| Position |
Vertical offset, horizontal offset |
| Secondary mask shapes |
| Locations |
Any combination of left, right, top, bottom |
| Position |
Horizontal and vertical offset with respect to the center of the primary mask shape |