| Mixed signal option, additional 16 logic channels |
| Vertical system |
| Input channels |
|
16 logic channels (from D15 to D0) |
| Arrangement of input channels |
|
arranged in two logic probes with 8 channels each, assignment of the logic probes to the channels D15 to D8 and D7 to D0 |
| Input impedance |
|
100 kΩ ± 2 % || ~4 pF (meas.) at probe tips |
| Maximum input frequency |
signal with minimum input voltage swing and hysteresis setting: normal |
400 MHz (meas.) |
| Maximum input voltage |
|
±40 V (Vp) |
| Minimum input voltage swing |
|
500 mV (Vpp) (meas.) |
| Threshold groups |
|
from D15 to D12, D11 to D8, D7 to D4 and D3 to D0 |
| Threshold level |
user range |
±8 V in 25 mV steps |
| predefined |
CMOS 2.5 V, TTL 1.4 V, ECL -1.3 V |
| Threshold accuracy |
|
±(100 mV + 3 % of threshold setting) |
| Comparator hysteresis |
|
small, medium, large |
| Horizontal system |
| Channel deskew |
range for each channel |
±500 ns |
| Channel-to-channel skew |
|
< 200 ps (meas.) for same vertical settings on the channels |
| Acquisition system |
| Sampling rate |
two logic probes |
2.5 Gsample/s on each channel |
| one logic probe |
5 Gsample/s on each channel |
| Memory depth |
two logic probes |
40 Msample for every channel |
| one logic probe |
80 Msample for every channel |
| Trigger system |
|
see chapter Trigger system of the base unit |
| Waveform measurements |
| Measurement sources |
|
all channels from D15 to D0 |
| Automatic measurements |
|
positive pulse width, negative pulse width, period, frequency, burst width, delay, phase, positive duty cycle, negative duty cycle, positive pulse count, negative pulse count, rising edge count, falling edge count |
| Additional cursor function |
|
display of hex value at the cursor position |
| Display characteristics |
| Channel activity display |
|
independent of the scope acquisition, the state (stays low, stays high or toggles) of the channels from D15 to D0 is displayed |