| Rohde and Schwarz NRP33TN Specifications |
| Frequency range |
R&S NRP33T(N) |
DC to 33 GHz |
| Impedance matching (SWR) |
DC to 100 MHz |
< 1.03 |
| > 100 MHz to 2.4 GHz |
< 1.06 |
| > 2.4 GHz to 12.4 GHz |
< 1.13 |
| > 12.4 GHz to 18.0 GHz |
< 1.16 |
| > 18.0 GHz to 26.5 GHz |
< 1.22 |
| > 26.5 GHz to 33.0 GHz |
< 1.28 |
| Power measurement range |
|
300 nW to 100 mW (–35 dBm to +20 dBm), continuous, in a single range |
| Maximum power |
average power |
0.3 W (+25 dBm), continuous |
| peak envelope power |
| R&S NRP18T(N) |
20 W (43 dBm) for max. 1 µs |
R&S NRP33T(N)/40T(N)/
50T(N)/67T(N) |
10 W (40 dBm) for max. 1 µs |
| Acquisition |
sample rate |
50 ksps (sigma-delta) |
| accuracy of time base |
±5 ppm |
| Zero offset |
after external zeroing5 |
< 25 nW (typ. 15 nW at 1 GHz) |
| Zero drift6 |
|
< 8 nW |
| Measurement noise7 |
|
< 25 nW (typ. 15 nW at 1 GHz) |
| Uncertainty for absolute power measurements25 |
|
+20 °C to +25 °C |
+15 °C to +35 °C |
0 °C to +50 °C |
| DC to 100 MHz |
0.040 dB |
0.046 dB |
0.067 dB |
| > 100 MHz to 2.4 GHz |
0.048 dB |
0.053 dB |
0.072 dB |
| > 2.4 GHz to 8.0 GHz |
0.054 dB |
0.059 dB |
0.079 dB |
| > 8.0 GHz to 12.4 GHz |
0.063 dB |
0.068 dB |
0.085 dB |
| > 12.4 GHz to 18.0 GHz |
0.082 dB |
0.086 dB |
0.100 dB |
| > 18.0 GHz to 26.5 GHz |
0.086 dB |
0.086 dB |
0.102 dB |
| > 26.5 GHz to 33.0 GHz |
0.101 dB |
0.105 dB |
0.121 dB |
| Uncertainty for relative power measurements26 |
|
0.010 dB |
| 5 Specifications expressed as an expanded uncertainty with a confidence level of 95 % (two standard deviations). For calculating zero offsets at higher confidence levels, use the properties of the normal distribution (e.g. 99.7 % confidence level for three standard deviations). |
| 6 Within one hour after zeroing, permissible temperature change ±1 °C, following a two-hour warm-up of the power sensor. |
| 7 Two standard deviations at 10.24 s integration time in continuous average mode, with aperture time set to default value. The integration time is defined as the total time used for signal acquisition, i.e. the product of twice the aperture time and the averaging number. Multiplying the noise specifications by √(10.24 s/integration time) yields the noise contribution at other integration times. Using a von Hann window function increases noise by a factor of 1.22. |
| 25 Expanded uncertainty (k = 2) for absolute power measurements. Specifications include calibration uncertainty, linearity and temperature effect. Zero offset and measurement noise must additionally be taken into account when measuring low powers, whereas zero drift is negligible over the entire measurement range. As a rule of thumb, the contribution of zero offset can be neglected for power levels above –20 dBm if external zeroing has been applied. The contribution of measurement noise can be neglected below 0.01 dB. |
| 26 Expanded uncertainty (k = 2) for relative power measurements on CW signals of the same frequency. Specifications include linearity and temperature effect. Zero offset and measurement noise must additionally be taken into account when measuring low powers, whereas zero drift is negligible over the entire measurement range. As a rule of thumb, the contribution of zero offset can be neglected for power levels above –20 dBm if external zeroing has been applied. The contribution of measurement noise can be neglected below 0.01 dB. See also the example in footnote 9 for taking into account zero offset and noise with relative measurements. |