12G-SDI Stress Test Toolset Option for QxP Series
The Phabrix PHQXPO-SDI-STRESS option is available for stress testing and R&D evaluations of SDI interfaces up to 12G. A comprehensive API is included for rapid automation testing. The option includes the ability, under automation control, to insert SDI clock jitter from 10 Hz to 10 MHz (128 UI max) peak-to-peak, mute any of the SDI outputs, and control the SDI scrambler, sync-bit insertion, pre-emphasis, rise time, and driver amplitude. The SDI-STRESS Eye amplitude measurement provides both Shorth Mean or Mode, with a histogram overlay and a user-defined window for the exploration of eye amplitude. PseudoRandom Binary Sequence (PRBS) generation and analysis of PRBS-7, -9, -15, -23, -31 allows for deterministic measurement of link Bit Error Rates (BER).
Advanced Generator Tools
- Control of jitter insertion frequency and amplitude
- SDI scrambler and sync bit insertion on/off
- SDI Bit Error (BER) insertion tool
- Control of SDI driver amplitude +/- 15%
- Control of pre-emphasis, rese/fall time
PRBS Analyzer
- Indication of PRBS cumulative received data and PRBS type
- Generation of PRBS-7, -9, -15, -23, -31
- Reported cumulative errors
- Calculated Bit Error Rate (BER)
Pathological Detector
- Generator status indication of rate at which the video pattern generator is creating SDI pathological conditions
- Indication of PLL and EQ pathological rates per second
- Detection on each active SDI link
- Realtime GPI outputs of pathological detect for external equipment triggering
Advanced Eye Analysis
- User-adjustable measurement window
- Automatic measurement of transition times and transition time delta
- Automatic amplitude measure with mode or shorth mean
- User-adjustable windowed histogram