N.A. 0.40, F.L. 8.6mm, W.D. 5.2mm

Meiji Techno MA947 Infinity corrected Strain Free Plan 20X Incident light Polarizing Upright Microscope Objective is made to the highest Japanese quality and optical standards, utilizing an Infinity Tube Lens Design F=200mm. Designed to meet the most advanced Polarizing and Geological imaging requirements. This objective represents the culmination of Meiji Techno’s Optical Japanese technology. This objective offers increased brightness and the highest possible N.A. in its class for maximum light gathering ability. Designed to correct lateral and axial chromatic aberrations over the entire field of view. This objective produce images that are flat, crisp and clear with high contrast and optical resolution. This objective works with a wide array of applications. The stated magnification is based on a Tube lens of 200 mm. DIN Standard mounting threads is 0.7965” (20.1MM) Diameter threads, 36 TPI (Threads per inch), 55° Whitworth. This objective is compatible with all Infinity Corrected Optical System.

The MA947 Strain free Plan 20X Infinity Corrected Optical System (I.C.O.S.) upright compound polarizing objective lens is also an option in our MT9900, MT9400, Polarizing Upright Series.

We understand the importance of having a Strain Free objective specially for use in most geological applications, to reduce spherical aberration and strain on the lens, tremendously improving the petrographic sample view. Whether one is looking at a thin section mineral sample or interference figures. These samples are viewed with polarizing microscopes in mineralogy, geological, petrographic applications. When designing objectives it is critical for Meiji Techno Japanese Engineers to set the ultimate resolution limit of the optical microscope. The important factors is to include the wavelength of light used to illuminate the specimen sample, the angular aperture of the light cone being captured by the objective and as important is the refractive index in the object distance between the objective front lens and the specimen. Resolution can be measured as the minimum detectable distance between two closely spaced specimen points of interest.