N.A. 0.75, F.L. 4.0mm, W.D. 0.38mm

The Meiji Techno MA926 Plan Semi Apo Epi BD 50X, dry Metallurgical Brightfield/Darkfield Objective Infinity Objective is made to the highest Japanese quality and optical standards, utilizing an Infinity Tube Lens Design F=200mm. Designed to meet the most advanced metallurgical brightfield /darkfield upright and inverted imaging requirements. This objective represents the culmination of Meiji Techno’s Japanese Optical technology. This objective offers increased brightness and the highest possible N.A. in its class for maximum light gathering ability. Designed to correct lateral and axial chromatic aberrations over the entire field of view. This objective produce images that are flat, crisp and clear with high contrast and optical resolution. This objective works with a wide array of applications. The stated magnification is based on a Tube lens of 200 mm. Nosepiece mounting threads is 26 MM diameter threads, 36 TPI (Threads per inch), 55° Whitworth. This objective is compatible with all Infinity Corrected Optical System.

MA926 Plan Semi Apo Epi BD 50X, dry Metallurgical Brightfield/Darkfield Objective Infinity Objective is also an option in our MT7500 and MT8500, IM7500, MC60, MC65, MC70, MC75, MCS-60, MCS-70 Metallurgical Brightfield /Darkfield Upright and Inverted Series

When Opaque specimens are examined with light from above the sample that is reflected back - this is referred to as episcopic illumination. These samples are viewed with metallurgical microscopes in metallurgy, engineering, manufacturing and other industrial applications. When designing objectives it is critical for Meiji Techno Japanese Engineers to set the ultimate resolution limit of the optical microscope. The important factors is to include the wavelength of light used to illuminate the specimen sample, the angular aperture of the light cone being captured by the objective and as important is the refractive index in the object distance between the objective front lens and the specimen. Resolution can be measured as the minimum detectable distance between two closely spaced specimen points of interest.