N.A. 0.65, F.L. 4.5mm, W.D. 0.5mm

Meiji Techno MA725 Infinity corrected Strain Free SM Plan M40X Incident light Polarizing Upright Microscope Objective is made to the highest Japanese quality and optical standards, utilizing a Finite Tube Lens Design F=160mm. N.A. 0.65 F.L. 4.50 mm, W.D. 0.50 mm Designed to meet the most advanced Polarizing and Geological imaging requirements. This objective represents the culmination of Meiji Techno’s Optical Japanese technology made specifically for our ML9400 Series. This objective offers increased brightness and the highest possible N.A. in its class for maximum light-gathering ability. Designed to correct lateral and axial chromatic aberrations over the entire field of view. This objective produces images that are flat, crisp, and clear with high contrast and optical resolution. This objective works with a wide array of applications. The stated magnification is based on a Tube lens of 160 mm. DIN Standard mounting threads are 0.7965” (20.1MM) Diameter threads, 36 TPI (Threads per inch), 55° Whitworth. This objective is compatible with all Infinity Corrected Optical Systems.

The MA725 Strain-free SM Plan M40X Infinity Corrected Optical System (I.C.O.S.) upright compound polarizing objective lens is also an option in our ML9400 Polarizing Upright Series.

We understand the importance of having a Strain Free objective, especially for use in most geological applications, to reduce spherical aberration and strain on the lens, tremendously improving the petrographic sample view. Whether one is looking at a thin section mineral sample or interference figures. These samples are viewed with polarizing microscopes in mineralogy, geological, and petrographic applications. When designing objectives it is critical for Meiji Techno Japanese Engineers to set the ultimate resolution limit of the optical microscope. The important factors are to include the wavelength of light used to illuminate the specimen sample, the angular aperture of the light cone being captured by the objective, and as important is the refractive index in the object distance between the objective front lens and the specimen. Resolution can be measured as the minimum detectable distance between two closely spaced specimen points of interest.