N.A. 0.85, F.L. 3.3mm, W.D. 0.3mm

The Meiji Techno MA335 B.D. S Plan 60X, dry Metallurgical Brightfield/Darkfield Objective Infinity Objective is made to the highest Japanese quality and optical standards, utilizing an Infinity Tube Lens Design F=200mm, and is made for our ML7500 and ML8500 Series. Designed to meet the most advanced metallurgical brightfield /darkfield upright imaging requirements. This objective represents the culmination of Meiji Techno’s Japanese Optical technology. This objective offers increased brightness and the highest possible N.A. in its class for maximum light gathering ability. Designed to correct lateral and axial chromatic aberrations over the entire field of view. This objective produces images that are flat, crisp, and clear with high contrast and optical resolution. This objective works with a wide array of applications. The stated magnification is based on a Tube lens of 200 mm. Nosepiece mounting threads are 30 MM diameter threads, 36 TPI (Threads per inch), and 55° Whitworth. This objective is compatible with all Infinity Corrected Optical Systems.

The Meiji Techno MA335 B.D. S Plan 60X, dry Metallurgical Brightfield/Darkfield Objective Infinity Objective is also an option in our ML7500 and ML8500 Metallurgical Brightfield /Darkfield Upright Series

When Opaque specimens are examined with light from above the sample is reflected back - this is referred to as episcopic illumination. These samples are viewed with metallurgical microscopes in metallurgy, engineering, manufacturing, and other industrial applications. When designing objectives it is critical for Meiji Techno Japanese Engineers to set the ultimate resolution limit of the optical microscope. The important factors are to include the wavelength of light used to illuminate the specimen sample, the angular aperture of the light cone being captured by the objective, and as important is the refractive index in the object distance between the objective front lens and the specimen. Resolution can be measured as the minimum detectable distance between two closely spaced specimen points of interest.