50W Output
As the complexity of today’s laser diode modules increases, higher power levels are needed in temperature controllers to address the module’s cooling needs during production test. The 50W (5A @ 10V) output allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions.
High Stability P-I-D Control
When compared with other TEC controllers, which use less sophisticated P-I (proportional-integral) loops and hardware control mechanisms, this instrument’s software-based, fully digital P-I-D control provides greater temperature stability and can be easily upgraded with a simple firmware change. The resulting temperature stability (±0.005°C short term, ±0.01°C long term) allows for very fine control over the output wavelength and optical power of the laser diode module during production testing of DC characteristics. This improved stability gives users higher confidence in measured values, especially for components or sub-assemblies in wavelength multiplexed networks. The derivative component of the instrument’s P-I-D control also reduces the required waiting time between making measurements at various temperature setpoints. The temperature setpoint range of –50°C to +225°C covers most of the test requirements for production testing of cooled optical components and sub-assemblies, with a resolution of ±0.001°C.
Adaptable to Evolving DUT Requirements
The Model 2510 is well suited for testing a wide range of laser diode modules because they are compatible with the types of temperature sensors most commonly used in these modules. In addition to 100W, 1kW, 10kW, and 100kW thermistors, they can handle inputs from 100W or 1kW RTDs, and a variety of solid-state temperature sensors. This input flexibility ensures their adaptability as the modules being tested evolve over time.
Programmable Setpoints and Limits
Users can assign temperature, current, voltage, and thermistor resistance setpoints. The thermistor resistance setpoint feature allows higher correlation of test results with actual performance in the field for laser diode modules because reference resistors are used to control the temperature of the module. Programmable power, current, and temperature limits offer maximum protection against damage to the device under test.
Accurate Real-Time Measurements
Both models can perform real-time measurements on the TEC, including TEC current, voltage drop, power dissipation, and resistance, providing valuable information on the operation of the thermal control system.
Peltier (TEC) Ohms Measurement
TEC devices are easily affected by mechanical damage, such as sheer stress during assembly. The most effective method to test a device for damage after it has been incorporated into a laser diode module is to perform a low-level AC (or reversing DC) ohms measurement. If there is a change in the TEC’s resistance value when compared with the manufacturer’s specification, mechanical damage is indicated. Unlike a standard DC resistance measurement, where the current passing through the device can produce device heating and affect the measured resistance, the reversing DC ohms method does not and allows more accurate measurements.