Instek GUT-6000A Digital IC Tester

The GUT-6000A is a desktop digital IC tester. Oriented toward automating testing tasks, the GUT-6000A contains high-end features such as auto-search and loop testing. Automated processes provide an intelligent and continuous process for detecting defective ICs. Self-diagnosis functions and over-load protection mechanisms make the GUT-6000A close to maintenance-free, releasing users from unnecessary hassles. The wide device coverage includes the 1800 series as well as the ubiquitous TTL and CMOS, providing a one-size-fits-all solution for an IC testing bench area.
 
User’s friendly sets up by replacing another IC; the GUT-6000A continues to undertake the task. The hardware design of the ''black-light'' function extends user’s convenience for testing ICs in an inadequate light environment. The Buzzer key built-in various tones can easily identify the testing result. The unique capability in identifying over 1800 CMOS/TTL digital ICs (up to 24 pins) surpasses the other major digital IC testers.

The GUT-6000A feature such as built-in ''auto search & test'' speeds to identify and test IC. In addition, the ''loop'' design for continuously testing function is intelligently applied to detect defective ICs and their stability. All these strengths provide significant conveniences for digital IC testers.

All the GUT-6000A accumulated incalculable benefits are to be discovered as users utilize the value-added, multi-functions equipped tester. This is the best choice for the factories, R&D sections, maintenance departments, laboratories as well as academics because it really creates a future with your business.

Other Features:

• The following IC series can be tested under 5V.
• Texas Instruments 54/74 TTL series.
• Motorola 14000 and RCA CD4000 CMOS series.
• Other compatible ICs with the above mentioned devices.
• “AUTO” function key supports “auto search and test” function. User only to put the IC into the socket, no need to press any key, no need to process any other movement, the “auto search and test’ will continue processing.
• "LOOP" function key supports “continue examining”, able to make sure reliability of the IC.
• Various “BUZZER” sounds to presents the test results "FAIL", or "PASS".