| In-circuit testing functions are integrated in a single measurement cabinet. Space-saving and customer-application-specific test facilities can be constructed. As well as providing faster in-circuit test performance than former models (testing S/O, components and ICs), a new macro test (impedance test) capability enables effective testing even when only a few measurement points are available. With Model 1220-01, testing efficiency is significantly improved. Because of its easy network confi guration, customers can operate the system as their requirements demand. Test data from multiple 1220s can be centrally managed by a server PC. Applications can be constructed to include operations such as capturing test history, statistical data and operating conditions of each machine.
Functions:
- Bad-Contact Retry, Reversed Polarity Retry/Retest functions
- FAIL Stop, Test Jump, Test Hold functions
- Test Data and Test Results Output functions
- FAIL Map Display function
- Mask Pin Setting function
- Surplus Test function
- Continuous FAIL Stop function
- Password Protection function
- Test Data Auto Backup function
- Read/Convert Existing Model Data (1105 data and text data)
- Switch Test (A/B) Data function
- Network Connectivity
- Remote Self-Diagnostics (available soon)
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