| In-circuit testing functions are integrated in a single measurement cabinet. Space-saving and customer-application-specific test facilities can be constructed. As well as providing faster in-circuit test performance than former models (testing S/O, components and ICs), a new macro test (impedance test) capability enables effective testing even when only a few measurement points are available. With Model 1220-00, testing efficiency is significantly improved.
Functions:
- Bad-Contact Retry, Reversed Polarity Retry/Retest functions
- FAIL Stop, Test Jump, Test Hold functions
- Test Data and Test Results Output functions
- FAIL Map Display function
- Mask Pin Setting function
- Surplus Test function
- Continuous FAIL Stop function
- Password Protection function
- Test Data Auto Backup function
- Read/Convert Existing Model Data (1105 data and text data)
- Switch Test (A/B) Data function
- Network Connectivity
- Remote Self-Diagnostics (available soon)
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