Hioki SM7810-20 Super MΩ HiTester Series

• Super Megohm Meter (220V) AC power supply
• Test the leakage current of MLCCs at the fastest speed of 6.8ms simultaneously over 8 channels
• Conduct high-speed leakage current testing of large-capacity MLCCs in the high current range (1mA)
• Improve testing reliability using the contact check function
• Build a flexible system by making best use of the individual settings of each channel

Providing Maximum Throughput for MLC Testing

The Super MΩ HiTESTER SM7810 is a super megohm meter that supports the leakage current of MLCC (Multi-Layer Ceramic Capacitors) at a rapid speed of 6.8ms across 8 channels simultaneously in production lines. With the dedicated POWER SOURCE UNIT SM7860 for multi-channel systems, you can expand your testing capabilities by applying voltage to a maximum of 32 channels using the 8-channel or 16-channel dual-line voltage setting function. An inspection test system combining the SM7810 and SM7860 is ideal for integration into automated measurement systems to build the fastest and most optimized MLCC leakage current inspection line possible.

Test System Ideal for MLCC Leakage Current Measurement

Features of MLCC Leakage Current Test System Combining the SM7810 and SM7860

• The Super MΩ HiTester SM7810 can be used to build an MLCC leakage current test line capable of performing 8-channel simultaneous measurement at the industry’s fastest speed of up to 6.8 ms, which helps to reduce the tact time of automated equipment and thus MLCC manufacturing costs.
• Combined use of the Super MΩ HiTester SM7810 and the Power Source Unit SM7860 enables building a test system ideal for integration into automated equipment. The power source unit can be selected depending on the maximum applied voltage and functionality to suit various types of test line, including the charge-and-discharge test line.

Performance Improvement

6.8 ms measurement time (from the acceptance of the trigger to INDEX output)

Measurement finishes in just 6.8 ms, including the contact check and decision (when the measurement speed is FAST). The measurement time was reduced by 30% compared to Hioki's conventional model, which helps to reduce the machine tact time.

Make individual settings for each channel

The range, measurement voltage, and comparator can be set for each channel. Simultaneous measurement can be performed in a combination of 8-channel x 1-stage, 4-channel x 2-stage, or 2-channel x 4-stage according to the system configuration, which provides flexibility to adapt to the configuration of the automated equipment.

Reliability Improvement

Improve reliability using contact check
Perform contact check despite the high-speed measurement. Elimination of judgment errors resulting from contact failure of the probe improves testing reliability.