• Fastest test speed of 0.5 msec (Analog measurement time)
• 0.07% measured value variability (When measuring a 1 nH coil at 3 GHz)
• ±0.65% rdg. basic accuracy
• Half-rack size body and palm-sized test head

Test head for the IM7583, IM7585, and IM7587

Stable measurement across a broad range

To achieve favorable frequency characteristics, we painstakingly carried out design true to our basic principles for the individual circuits, board patterning, and case structure. We also used numerical analysis and in-depth verification to optimize the shield structure and the shape of the internal board pattern, thus fitting all the technology necessary to achieve optimal frequency characteristics from 100 kHz to 3 GHz into a compact body. For the test head measurement terminals, in order to improve their measurement accuracy over a wide range, we used 3.5 mm (0.14 in) connectors with a wide frequency range, which also boast better removability than other microwave connectors.

Measurement technology that adds to superior stability

The measurement portion uses a high resolution A/D converter. By controlling the input signal's level and frequency, the A/D converter's dynamic range can be utilized to the fullest, achieving measurement with a wide impedance range and minimum variability. In the sub FPGA, built into analog circuits, the digital filter applied optimally for each circuit shuts out noise. At the main FPGA, the 64-bit floating point computation is put through a multi-layered pipeline to achieve high-speed computational processing with little margin of error. This helps increase the stability and speed of measurements.

Large solid shield for improved performance

Each section uses a solid shield carved to match the on-board pattern or IC shape, thus reducing internal coupling. The shield also reduces external radiation and improves noise resistance, meeting a high level of EMC, despite being the lightest in its class.