Hioki IM7585-02 Impedance Analyzer

1. High-frequency measurement at up to 600 MHz (IM7583) or 1.3 GHz (IM7585)
The IM7583 and IM7585 offer measurement frequencies ranging from 1 MHz to 600 MHz and from from 1 MHz to 1.3 GHz, respectively. Both of these ranges far outstrip the measurement frequency range of the IM7580 that was launched last year (1 MHz to 300 MHz).

LCR meter mode, which makes measurements at a single frequency, is ideal for identifying defective components, while analyzer mode, which makes measurements while varying the frequency, can be used to evaluate characteristics during the product development process. In this way, the instruments can be used in a variety of fields and applications.

2. Improved productivity thanks to high-speed measurement in as little as 0.5 ms and high-stability measurement
The IM7583 and IM7585 deliver high-speed measurement in as little as 0.5 ms (0.0005 sec.). This level of performance can dramatically boost productivity for electronic component manufacturers that need to quickly test large volumes of electronic components.

In addition, measurement repeatability is 0.07% (representative value at 1 GHz) for the IM7585, highlighting the instrument's ability to deliver stable measurement in order to improve manufacturing yields and raise productivity.

3. Compact footprint to help reduce production costs
Electronic component manufacturers create automated testing systems for use on production lines by mounting instruments on racks. By delivering the IM7583 and IM7585 with the same compact footprint as last year's IM7580, Hioki is making it possible for operators to implement compact testing systems and to shorten testing times by incorporating multiple instruments. The ultimate result of this innovation is lower production costs.

4. Extensive functionality for generating pass/fail judgments
In LCR meter mode, which makes measurements at a single frequency, the instruments provide a comparator function for generating pass/fail judgments for electronic components and a BIN function for sorting components. The comparator function uses operator-specified upper and lower limit values as the judgment standard. Whereas the comparator function makes pass/fail judgments against a single judgment standard, the BIN function allows operators to program up to 10 judgment standards and then ranks components against them.

Analyzer mode, which makes measurements at multiple frequencies, offers area and peak judgment as methods for making pass/fail judgments based on electronic components' frequency characteristics. Area judgment is used to verify whether measured values fall within a preconfigured judgment area, while peak judgment is used to determine resonance points.

The instruments also offer a new spot judgment function that makes pass/fail judgments based on multiple frequencies set by the operator.

High-speed, Highly Stable Measurement

To Boost your Production Volume- Measurement capabilities suited to a variety of production lines

Contact Check Function (DCR measurement, Hi-Z reject)

Per form contact checks using DCR measurement on components such as inductors, ferrite cores, and common mode filters. The IM7585 can also perform contact checks using Hi-Z reject functionality for components such as capacitors. Both of these capabilities can be combined with a chatter detection check to deliver highly reliable measurements.

Half-rack dimensions and intuitive operability enhances productivity

The compact design lets you stack two units side-by-side to mount into a full-rack space so that you can use two Impedance Analyzers simultaneously to further streamline testing and increase production yield. Customize the brightness, color and viewing size of the large color display in order to accommodate the needs of your workspace, and use the convenient touch screen to achieve maximum work efficiency.

The bundled test head is also compact and unobtrusive, letting you set it as close to the device under test as possible in order to minimize noise and other adverse effects that can impact accuracy.