Measurement Statistics |
Available Statistics | Mean, Minimum, Maximum, Standard Deviation |
Number of Measurements | 2 to 1,000,000 Statistics may be collected on all measurements or on only those which are between the limit bands. When the Limits function is used in conjunction with Statistics, N (number of measurements) refers to the number of in-limit measurements. In general, measurement resolution will improve in proportion to N, up to the numerical processing limits of the instrument. |
Measurements | Statistics may be collected for all measurements except Peak Volts and Totalize. |
General Information |
Save and Recall | Up to 20 complete instrument setups may be saved and recalled later. These setups are retained when power is removed from the counter. |
Rack Dimensions (HxWxD) | 88.5 mm x 212.6 mm x 348.3 mm |
Weight | 3.5 kg maximum |
Warranty | 1 year |
Power Supply | 100 to 120 VAC ± 10% -50, 60 or 400 Hz ± 10% 220 to 240 VAC ± 10% -50 or 60 Hz ± 10% |
ac Line Selection | Automatic |
Power Requirements | 170 VA maximum (30 W typical) |
Environment | 0º C to 55º C operating –40º C to 71º C storage |
Remote Interface | GPIB (IEEE 488.1-1987, IEEE 488.2-1987) |
Remote Programming Language | SCPI-1992.0 (Standard Commands for Programmable Instruments) |
Safety | Designed in compliance with IEC-1010, UL-3111-1 (draft), CAN/CSA 1010.1 |
EMC | CISPR-11, EN50082-1, IEC 801-2, -3, -4 |
Radiated Testing | Immunity When the product is operated at maximum sensitivity (20 mVrms) and tested at 3 V/m according to IEC 801-3, external 100 to 200 MHz electric fields may cause frequency miscounts. |