| Mask test source |
Analog channels 1, 2, 3, or 4 |
| Maximum test rate |
5000, 6000, 7000 Series: Up to 100,000 waveforms tested per second
3000 and 4000 X-Series: Up to 270,000 waveforms tested per second
2000 X-Series: Up to 50,000 waveforms tested per second
6000 X-Series: Up to 130,000 waveforms tested per second |
| Acquisition modes |
Real-time sampling–non-averaged, Real-time sampling–averaged |
| Mask creation |
| Automask-divisions |
+/- X divisions, +/- Y divisions |
| Automask-absolute |
+/- X seconds, +/- Y volts |
| Mask file import |
Up to 8 failure regions (created in text editor) |
| Mask scaling |
Source lock on (mask automatically re-scales with scope settings)
Source lock off (mask scaling fixed relative to display when loaded or created) |
| Test criteria |
Run until forever, Minimum number of tests, Minimum time, Minimum sigma, |
| Action on error |
Stop acquisitions, save image, print, perform measurements |
| Trigger output |
On failure |
| Statistics display |
Number of tests, Number of failures (for each channel tested), Failure rate (for each channel tested), Test time
(hours – minutes – seconds), Sigma (actual versus maximum without failures) |
| Display formats |
Mask – translucent gray, Failing waveform segments – red, Passing waveform segments – channel color |
| Save/recall |
4 non-volatile internal registers (.msk format), USB memory stick (.msk format) |